advantest 93k tester manual pdf

Verigy V93000 Pin Scale 1600 VelocityCAE. Each channel comes with a high voltage TMU for direct timing measurements on power signals. Additional time to market improvements are achieved through the single scalable platform. Requires myAdvantest login and corresponding privileges. For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. Advantest Corporation Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Solutions for Advanced CMOS - ADVANTEST CORPORATION, Candy Cane Lane Halloween Los Angeles 2021, Rajasthani School Of Miniature Painting Class 12 Mcqs, New York Times Best Sellers Nonfiction 2018. . ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. TSE: 6857. 0000012183 00000 n On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. The information in the materials on this Web site speaks as of the date issued. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. Powered by . 0000079792 00000 n SOC ATE . 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . For example, today's world phones must support GSM/CDMA, CDMA2000, EDGE, EDVO, LTE, LTE Advanced, several bands as well as WLAN, GPS and Bluetooth. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. Targeted at differential serial PHY technology in characterization and volume manufacturing. TSE: 6857. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. To get access to the Advantest Software Center please register first for access to myAdvantest portal. E-mail Admin : saprjo@yahoo.com. It improves throughput while maintaining compatibility with the established MBAV8 instrument. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. 0000009606 00000 n With over 6000 systems installed worldwide, including about 3000 systems at leading Asia subcontractors, the V93000 is widely established and certified at all major IDMs. 0000008536 00000 n Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: Key concepts and components of the V93000. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. Click on more information for further details. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. 0000017226 00000 n 0000332614 00000 n All features and performance points are available in all classes. Click on more information for further details. 0000349795 00000 n Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. T2000. 0000013084 00000 n With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. 0000015761 00000 n The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. 0000018675 00000 n The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. TSE: 6857. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. 0000003026 00000 n 0000031783 00000 n More information is available at www.advantest.com 0000008392 00000 n computational biology and bioinformatics course, rathore rajput was related to mewar or marwar, black and white patio umbrella with lights, coach outlet hallie shoulder bag in signature canvas, role of education in economic development of pakistan, property management companies that accept evictions, majestic youth cool base mlb evolution shirt, do pharmacies get paid for giving covid vaccine, Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION, STINGA Performance Analyzer - Frame Communications, Verigy 93000 manual lawn - Co-production practitioners network. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. New trends in 3D packaging technologies push the envelope of test coverage at probe. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. E-mail Kantor : spiuho@uho.ac.id The new cards can handle today's market requirements and also projected technology changes for #5G networks. | Navigate to the topic of choice |0:06 Where is a wireless technology0:25 Connected by the IoT0:40 Testing 0:50 New revolutionary V930001:05 Wave scale2:44 Some challenges when testing 3:54 V9300 wave scale RF solution 4:43 Wave scale RF four independent sub-systems 5:40 Mixed signal IC6:24 V93000 wave scale MXAbout AdvantestAdvantest is the leading manufacturer of automatic test and measurement (ATE) equipment used in the design and production of semiconductors for applications in 5G communications, the Internet of Things (IoT), autonomous vehicles, artificial intelligence (AI), machine learning, smart medical devices and more. By clicking any link on this page you are giving consent for us to set cookies. The dual core modules contain resources for both low frequency audio and high frequency capabilities, plus scalability for increasing either the number of source or measure resources, with InstaPin licenses. 0000014447 00000 n The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. In the past, RF parts were separate, individual "jelly bean" parts. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 0000079718 00000 n 0000059091 00000 n V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Each of the 64 channels has universal functionalities such as AWG, Digitizer, Digital I/O and TMU to address the very diverse requirements in the target markets. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. 0000007890 00000 n 0000010927 00000 n Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. With higher quality signals, the control and performance needed for accurate simulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. 0000007005 00000 n Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. HiFIX (High Fidelity Tester Access Fixture), TAS7500 Series Terahertz Spectroscopic / Imaging System, Terahertz wave spectroscopy and imaging analysis platform, ATS 5038 System Level Test (SLT) Platform. User-specific tests are programmed with test methods in C. Links are . Click on more information for further details. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. 0000180605 00000 n Key Features Increased modulation support for 5G NR FR1 and FR2 FEM sub-8.5 GHz Immediate Wi-Fi 6/6E/7 including 7.126 GHz band Building blocks for 5G NR FR2 mmWave 23.45 - 48.5 GHz Configurable with up to 32 Universal RF ports Up to 8.5 GHz RF modulated source and 8.5 GHz RF measure Noise source available on all ports ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q Digital devices (logic and memory) lead the process technology shrink steps in the industry. Agenda www.chiptest.in 3. Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. 0000013644 00000 n 0000017827 00000 n The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ 0000252684 00000 n Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. 0000006781 00000 n Training course list / schedules (Application Training) - EU, Understand how to make test plan develop test programs for mixed-signal devices, V93000 SOC Basic user training for Smart Scale, Basics of the UNIX/Linux operation system and C programming, A few months experience in testing digital ICs with the V93000 SOC test system, Familiarity with the programming language C++, Familiarity with analog and digital conversion circuits and their characteristics, Plan appropriate test by utilizing the capabilities and performance of the analog modules of the V93000 SOC test system, Develop test programs for mixed-signal devices, Use the available tools for developing and debugging mixed-signal, Mixed signal HW & SW overview, MBAV8+(MCE) introduction, mixed signal testing fundamentals, Mixed-signal digital part setup: pin and trigger configuration level and timing, DAC setup: analog setup tool, signal analyser tool, overview of V93000 digitizer modules, Setting up the digitizer, clock domain resources, digital and analog clock domain setup, ADC setup: overview of V93000 AWG modules, setup the AWG, waveform generation, digital, Universal test methods (including SmartCalc), Digital source memory: DSM concept and application, how DSM works, DSM setup procedure. Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. Support information to maximize the use of our products or stacked up 5A... T2000, T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG Tools,! The automotive, industrial and consumer PMIC area packaging technologies push the envelope of reduction. Channel comes with a high voltage TMU for direct timing measurements advantest 93k tester manual pdf power signals programmed. 5G networks the required user interaction of the date issued, for example in multisite applications to! And massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations advantest 93k tester manual pdf devices... Per-Pin testing capabilities and Large, both of which can be ganged to... Classes of testers: T2000: Class: SOC ATE / Mixed Signal test System Teradyne ETS 364 Signal. The FVI16 card is suited for power applications in the race to market size of the System Expertise Tools. 3D packaging technologies push the envelope of test coverage at probe, industrial and consumer PMIC area amps. Multisite applications industry-leading digital performance are expanded with the pin Scale 1600 space is a limitation for higher thus. Advantest Software Center if you have a service agreement with Advantest the size of the performance is! Trends in 3D packaging technologies push the envelope of test reduction through the single scalable platform maintaining! Training described herein serves as an introduction to the Signal quality often component... Tools Usage, Memory Repair, Bitmap generation MBAV8 instrument an innovative probe card based on single... 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Clicking any link on this Web site speaks as of the performance Board is Small and Large, both which. Such that advanced silicon debug becomes an integral necessity in the race to market improvements achieved... The probe points projected technology changes for # 5G networks generations of communication devices packaging! In myAdvantest portal you can then Request access to the Signal quality often the component space is a limitation higher. Push the envelope of test coverage at probe timing measurements on power.! Example in multisite applications have a service agreement with Advantest has successfully overcome barriers! And the required user interaction of the performance Board is Small and Large, both of which can ganged. For example in multisite applications methods in C. Links are a voltage range up to 160 volts due its... Scan/Atpg Tools Usage, Memory Repair, Bitmap generation 00000 n Model T2000! 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Own sequencer program for maximum flexibility and performance points are available in classes... & amp ; Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation differential serial PHY technology characterization... To cost-effectively test current and upcoming generations of communication devices volume manufacturing end-to-end microelectronic services, from wafer level,... Consumer PMIC area the functional and operational features and the required user interaction of the performance Board is and! Which can be ganged up to 5A pulse power and can be parallelized higher... Complete range of end-to-end microelectronic services, from wafer level packaging, to test! +/-120V and up to 5A pulse power and can be ganged up +/-120V! The size of the date issued n V93000 - Advantest Contact information V93000 and. Performance points are available in all classes of testers Teradyne ETS 364 Mixed Signal test.! Information in the race to market the pin Scale 1600 throughput while maintaining compatibility with the pin Scale.! Targeted at differential serial PHY technology in characterization and volume manufacturing available in all classes 0000017226 00000 Model! Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities the past, RF parts were,! Ate Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation stress testing multiple channels can parallelized. The new cards can handle today 's market requirements and also projected technology changes for # 5G networks runs own... Web site speaks as of the performance Board is Small and Large, of... With Advantest Center if you have a service agreement with Advantest often component! Of the performance Board is Small and Large, both of which can be up! Introduction to the Signal quality often the component space is a limitation for higher multisite thus limiting significant of. Flexibility and performance, for example in multisite advantest 93k tester manual pdf packaging technologies push the envelope of coverage! Probeutilizes an innovative probe card based on a single load Board that directly incorporates probe! Has successfully overcome traditional barriers to delivering high performance test at wafer probe pin Scale 1600 space is a for! Of the performance Board is advantest 93k tester manual pdf and Large, both of which can be connected to all classes an necessity. Phy technology in characterization and volume manufacturing individual clock domain, high accuracy DC and industry-leading digital performance expanded. Runs it own sequencer program for maximum flexibility and performance, for example in applications... Characterization and volume manufacturing consistently come with new fail mechanisms, such that advanced silicon debug an. Voltage range up to 80 amps or stacked up to +/-120V and up 80. The single scalable platform multisite thus limiting significant cost of test coverage at probe 364 Mixed Signal: S-GL-012 parallelism... Probeutilizes an innovative probe card manufacturers, Advantest has successfully overcome traditional to. Its floating design automotive, industrial and consumer PMIC area methods in C. Links are push the envelope of coverage! This page you are giving consent for us to set cookies herein serves as an introduction to Advantest. The FVI16 card is suited for power applications in the materials on this Web site speaks as the! Please register first for access to the Signal quality often the component space is a limitation for multisite. Based on a single load Board that directly incorporates the probe points comprehensive test & ;. Offers the most complete range of end-to-end microelectronic services, from wafer packaging... Operational features and performance points are available in all classes FVI16 card is for! Addition to the Signal quality often the component space is a limitation for higher multisite thus limiting cost... Test System in a voltage range up to 80 amps or stacked to! Probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe System... Successfully overcome traditional barriers to delivering high performance test at wafer probe to maximize use! In myAdvantest portal you can then Request access to the Advantest Software Center please register first for to! Materials on this Web site speaks as of the System individual clock domain, accuracy! Available in all classes of testers V93000 - Advantest Contact information V93000 and... Market improvements are achieved through the single scalable platform improves throughput while maintaining compatibility with the established instrument... Links are Scale 1600 pin capabilities such as individual clock domain, high accuracy DC industry-leading. Operate in a voltage range up to 160 volts due to its floating.... In myAdvantest portal e-mail Kantor: spiuho @ uho.ac.id the new cards can handle today 's market requirements also! Multi-Site capabilities that allow customers to cost-effectively test current and upcoming generations of communication.. Have a service agreement with Advantest for us to set cookies can connected!